电线电缆网 > 数据 高频线缆 > 发泡工艺生产的芯线老化试验(完整版)
发泡工艺生产的芯线老化试验 - 无图版
michael --- 2007-05-24 18:33:53
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余泽平 --- 2007-05-26 16:00:27
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UL758-2006新版好像规定在2008年5月1日后对AWM style1598, 1598等芯线需要作老化抗张及延伸等测试
但我也一直没有向UL索要到新版的正本
李小龍 --- 2007-05-26 16:35:26
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余泽平 --- 2007-05-26 17:22:28
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更正:
UL AWM style 1598, 1589等
michael --- 2007-05-29 11:13:48
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WONDERFUL --- 2007-06-06 10:27:00
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学习中!
michael --- 2007-06-06 10:58:45
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参见UL444:有规定发泡实验:
6.3.2.4 Specimens of PVDF rated 125°C, foamed, or multi-layered insulations 305 mm (13 in) long shall
be placed in a circulating-air oven conforming to ASTM Standards D 5423 (Type II ovens) and D 5374
and aged for the appropriate time and temperature shown in Table 9 for the insulation adjacent to the
conductor. When the insulation is foamed, the aging shall be as specified for the solid insulation. A
minimum of six specimens shall be tested. Insulations with band-marking inks may have the ink removed
before specimens are aged. After removal from the oven, the specimens shall rest for 16 – 96 h in still air
at room temperature and then be wound tightly, for six close turns, around a mandrel having a diameter
no greater than that of the insulated conductor under test. The insulation shall be examined for cracks
using a lens having magnification of 5X. The insulated conductor shall then be straightened, one side of
the tube of insulation sliced off with a knife or razor-blade, and the conductor removed for examination of
the inner surface of the insulation. There shall be no cracks on either the inside or the outside surface of
the insulation.